KYRYCHENKO, M. ; HILLMANN, S. ; MACHER, F. ; SCHULZE, M. ; HEUER, H. ; CAMERINI, C. ; PEREIRA, G. R. .
Resumo: This paper is focused on eddy current measurements of C/SiC samples in different status of the manufacturing process. The measurements are compared with results of X-Ray, Scanning Acoustic Microscope (SAM) and optical images and discussed.
